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Dr. Arman Davtyan

Research Fellow

Department of Physics, University of Siegen
Emmy-Noether-Campus
Walter-Flex-Str. 3, 57072 Siegen
Room: B-011

Tel :  +49 (0)  271 740 3713 

Email: davtyan@physik.uni-siegen.com


                                                                                                                                                     
 

Research Interests

Application of X-ray diffraction based imaging techniques to study the structure of nano-scale materials.

Experience: Coherent X-ray diffraction imaging - semiconductor nanowires - iterative dual space algorithms - FEM simulations
- thin film structure determination - synchrotron radiation - phase retreival.

Academic experience

 02 / 2013 - 03/2018

 PhD, Solid State Physics, University of Siegen, Germany

” Distribution of phase domains in semiconductor nanowires”

  04 / 2010 - 12/2012

  MSc degree , Solid State Physics, University of Siegen, Germany 

 ”Application of soft X-ray reflectivity and spectroscopy for thin organic films”

 09 / 2003 -  06 / 2007

 BSc degree of Physics, Yerevan State University, Yerevan, Armenia.

”Temporal and spectral description of distributed feedback lasers”

Teaching

Advanced Laboratory Course, Master of Phyiscs,  University of Siegen, Germany,  2013-2018


Lecture: Nanoscience, Master of Phyiscs,  University of Siegen, Germany, Winter semester, 2018  (In English)

Selected publications

1. S. Gorfman, A. A. Bokov, A. DAVTYAN, M. Reiser, Y. Xie, ZG. Ye, A. Zozulya, U. Pietsch, C. Gutt: Ferroelectric domain wall dynamics characterized with X-ray photon correlation spectroscopy, PNAS (2018). 115 (29), E6680-E6689

2. A. DAVTYAN, V. Favre-Nicolin, R.B.Lewis, H. Küpers, L. Geelhaar, D. Kriegner, D. Bahrami, A. Al-Hassan, G. Chahine, O. Loffeld, U. Pietsch: Coherent X-ray diffraction imaging meets ptychography to study core-shell-shell nanowires, MRS Advances (2018). v3, i39 2317-2322

3. A. DAVTYAN, S. Lehmann, D. Kriegner, R. R. Zamani, K. A. Dick, D. Bahrami, A. Al-Hassan, S. J. Leake, U. Pietsch, V. Holý: Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction, J. Synchrotron Rad. (2017). 24, 981-990

4. A. DAVTYAN, T. Krause, D. Kriegner, A. Al-Hassan, D. Bahrami, S. M. M. Kashani, R. B. Lewis, H. Küpers, A. Tahraoui, L. Geelhaar, M. Hanke, S. J. Leake, O. Loffeld, U. Pietsch: Threefold rotational symmetry in hexagonally shaped core–shell (In, Ga) As/GaAs nanowires revealed by coherent X-ray diffractio imaging, J. Appl. Cryst. (2017). 50, 673-680

5. A. DAVTYAN, A. Biermanns, O. Loffeld, U. Pietsch: Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging, New Journal of Physics (2016), 18 063021

6. A. Seel, A. DAVTYAN, U. Pietsch, O. Loffeld: Norm-Minimized Scattering Data from Intensity Spectra, Mathematical Problems in Engineering Volume (2016), Article ID 9853714

7. D. Ksenzov, Ch. Schlemper, A. DAVTYAN, S. Bajt, F. Schäfers, U. Pietsch: A setup for probing ultrashort soft X-ray diffraction by means of curved multilayer structures, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 269.19 (2011): 2124-2129

 
Dr. Arman Davtyan