Research Fellow
Department of Physics, University of Siegen Emmy-Noether-Campus Walter-Flex-Str. 3, 57072 Siegen Room: B-011
Tel : +49 (0) 271 740 3713 Email: davtyan@physik.uni-siegen.com
Research Interests
Application of X-ray diffraction based imaging techniques to study the structure of nano-scale materials.
Experience: Coherent X-ray diffraction imaging - semiconductor nanowires - iterative dual space algorithms
- FEM simulations
- thin film structure determination
- synchrotron radiation
- phase retreival.
Academic experience
02 / 2013 - 03/2018 |
PhD, Solid State Physics, University of Siegen, Germany
” Distribution of phase domains in semiconductor nanowires”
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04 / 2010 - 12/2012
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MSc degree
, Solid State Physics, University of Siegen, Germany
”Application of soft X-ray reflectivity and spectroscopy for thin organic films”
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09 / 2003 - 06 / 2007 |
BSc degree of Physics, Yerevan State University, Yerevan, Armenia.
”Temporal and spectral description of distributed feedback lasers”
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Teaching
Advanced Laboratory Course, Master of Phyiscs, University of Siegen, Germany, 2013-2018
Lecture: Nanoscience,
Master of Phyiscs, University of Siegen, Germany, Winter semester, 2018 (In English)
Selected publications
1. S. Gorfman, A. A. Bokov, A. DAVTYAN, M. Reiser, Y. Xie, ZG. Ye, A. Zozulya, U. Pietsch, C. Gutt: Ferroelectric domain wall dynamics characterized with X-ray photon correlation spectroscopy, PNAS (2018). 115 (29), E6680-E6689
2. A. DAVTYAN, V. Favre-Nicolin, R.B.Lewis, H. Küpers, L. Geelhaar, D. Kriegner, D. Bahrami, A. Al-Hassan, G. Chahine, O. Loffeld, U. Pietsch: Coherent X-ray diffraction imaging meets ptychography to study core-shell-shell nanowires, MRS Advances (2018). v3, i39 2317-2322
3. A. DAVTYAN, S. Lehmann, D. Kriegner, R. R. Zamani, K. A. Dick, D. Bahrami, A. Al-Hassan, S. J. Leake, U. Pietsch, V. Holý: Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction, J. Synchrotron Rad. (2017). 24, 981-990
4. A. DAVTYAN, T. Krause, D. Kriegner, A. Al-Hassan, D. Bahrami, S. M. M. Kashani, R. B. Lewis, H. Küpers, A. Tahraoui, L. Geelhaar, M. Hanke, S. J. Leake, O. Loffeld, U. Pietsch: Threefold rotational symmetry in hexagonally shaped core–shell (In, Ga) As/GaAs nanowires revealed by coherent X-ray diffractio imaging, J. Appl. Cryst. (2017). 50, 673-680
5. A. DAVTYAN, A. Biermanns, O. Loffeld, U. Pietsch: Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging, New Journal of Physics (2016), 18 063021
6. A. Seel, A. DAVTYAN, U. Pietsch, O. Loffeld: Norm-Minimized Scattering Data from Intensity Spectra, Mathematical Problems in Engineering Volume (2016), Article ID 9853714
7. D. Ksenzov, Ch. Schlemper, A. DAVTYAN, S. Bajt, F. Schäfers, U. Pietsch: A setup for probing ultrashort soft X-ray diffraction by means of curved multilayer structures, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 269.19 (2011): 2124-2129
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