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Showcast of latest results:

Multiple-path depth imaging with ToF sensors

Dr. Miguel Heredia Conde (ZESS) and Dr. Thomas Kerstein (pmdtechnologies AG) presented a demo showcasing the latest results of the cooperation between both institutions in the field of multiple-path depth imaging with ToF sensors at the 18th IEEE SENSORS conference, which took place in October 2019 in Montreal (Canada). The live demo served as proof-of-concept of prior work of the authors (Miguel Heredia Conde, Ayush Bhandari, Thomas Kerstein, Bernd Buxbaum, and Otmar Loffeld) in coping with Multiple-Path Interference (MPI), a main error source in ToF depth imaging. Making use of a realistic setup, the demo shows that it is feasible to resolve more than a single light path per pixel at acceptably high frame rates.


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