Vom 14. - 15. Mai 2020 findet der nächste Workshop des Instrumentation & Measurement Chapter IEEE Germany Section statt.
Lecture Compressive Sensing (CS) Tuesday, 14 - 18 pm, PB - H 0103 Dr. M. Heredia-Conde
Make sensing smart ... Center for Sensor Systems (ZESS)
"Multimodal Sensorics/Imaging Systems"
Host of Structured Doctoral Programmes
Multiple-path depth imaging
with ToF sensors
Dr. Miguel Heredia Conde
(ZESS) and Dr. Thomas Kerstein (pmdtechnologies
AG) presented a demo showcasing the latest
results of the cooperation between both
institutions in the field of multiple-path
depth imaging with ToF sensors at the 18th IEEE
SENSORS conference, which took place in October
2019 in Montreal (Canada). The live demo served
as proof-of-concept of prior work of the
authors (Miguel Heredia Conde, Ayush Bhandari,
Thomas Kerstein, Bernd Buxbaum, and Otmar
Loffeld) in coping with Multiple-Path
Interference (MPI), a main error source in ToF
depth imaging. Making use of a realistic setup,
the demo shows that it is feasible to resolve
more than a single light path per pixel at
acceptably high frame rates.