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Home of "Multimodal Sensorics/Imaging Systems" Host of Structured Doctoral Programmes
Multiple-path depth imaging
with ToF sensors
Dr. Miguel Heredia Conde
(ZESS) and Dr. Thomas Kerstein (pmdtechnologies
AG) presented a demo showcasing the latest
results of the cooperation between both
institutions in the field of multiple-path
depth imaging with ToF sensors at the 18th IEEE
SENSORS conference, which took place in October
2019 in Montreal (Canada). The live demo served
as proof-of-concept of prior work of the
authors (Miguel Heredia Conde, Ayush Bhandari,
Thomas Kerstein, Bernd Buxbaum, and Otmar
Loffeld) in coping with Multiple-Path
Interference (MPI), a main error source in ToF
depth imaging. Making use of a realistic setup,
the demo shows that it is feasible to resolve
more than a single light path per pixel at
acceptably high frame rates.
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