Interconnected Automation Systems (IAS)

Guest lecture by Prof. Ramesh Rayudu titled: “Do We Need to Change the Way We Transmit Electricity in Our Countries? A Look at How Power Electronics Is Taking Over Our Infrastructure”

Based on the paper “RHINO-MAG: Exploring Data-Driven Recursive Magnetic Material Models” from the IEEE PELS MagNet Challenge 2025, we will present our modeling methodology and the empirical results we have obtained during a webinar on June 25, 2026. 

The new electrical engineering teaching laboratory for networked automation systems has been opened at the University of Siegen. The rooms were extensively renovated and brought up to the latest technical standards at a cost of around 3 million euros.

The IAS team is pleased to invite you to this year's Advent table tennis tournament (see flyer). The organizational dates are:

• December 17, 2025 starting at 16:00 in H-C 3305
• Random doubles with draw of the pairs on site
• Snacks and drinks will be provided

Both active players and spectators are cordially invited to the social get-together.

For better planning, we ask for feedback via https://terminplaner6.dfn.de/b/cf8b69bfba53d5d47d4aa4ed921ae6cf-1470146
for better planning.

Together with our partners at the University of Paderborn, we recently published an article in IEEE Transactions on Power Electronics entitled “Universal Direct Torque Controller for Permanent Magnet Synchronous Motors via Meta-Reinforcement Learning.” The article addresses highly automated controller synthesis for any permanently excited synchronous drives and demonstrates how a control strategy learned using data-driven algorithms can be transferred from simulative training to real-world laboratory applications. The methodology and empirical investigation presented represent an important step toward the autonomous commissioning of power electronic systems in heterogeneous application contexts in order to achieve optimal system performance with minimal (human) effort.

Link to open access publication: https://ieeexplore.ieee.org/document/11263992

DOI: 10.1109/TPEL.2025.3635741